PublishedSchiffer Publishing, June 2015 |
ISBN9780764349102 |
FormatHardcover, 320 pages |
Dimensions27.9cm × 21.5cm |
The fourth edition of Schiffer Fashion Press's (SFP) runway compendium tells the story of the Spring 2015 New York Fashion Week collections from "Atelier to Runway." Sketches, inspirations, mementos, swatches, and mood boards from the studios of five top designers offer insights into the creative process behind the collections.
The story further unfolds with compelling backstage coverage gathered before 10 runway shows. Here you'll see the pre-runway excitement of hair stylists, makeup artists, and designers creating the final look. Finally, over 1,500 runway and presentation images from the collections of 69 designers complete this New York Fashion Week experience. Complementing this dramatic fashion narrative, this volume also presents street fashion photography and an expanded trend guide with more details and analysis, plus hair and makeup coverage. Come behind the scenes with us to experience everything that makes this week the most exciting time in American fashion.
